Description

Focused ion beam (FIB) microscopy is an essential tool for analyzing semiconductor device processing. By using a beam of Gallium ions, a device may be cut in half for cross-sectional imaging with an electron microscopy.

In this image, a FIB cross section was made on a GaN microLED. If you look closely, you can see a hand grasping the left side of the LED with the thumb in the center of the image. MicroLEDs are pretty popular these days, so it's hard to keep other people's hands off my GaN.