Heart of a Wafer

Year: 
2016
Ranking: 
Entrant
Artist: 
Fan Lin
Lab: 
SoC Design and Test Lab

Description

A data transformation based on the characteristics of semiconductor chips on a wafer (left) reveals the hidden correlation among the chips, which, when visualized in the transformed space (right), demonstrates a colorful heart.

Kernel PCA (principal component analysis) based on the test measurements of the semiconductor chips on a wafer maps the samples into a transformed space, in a unique way. The samples were colored to visualize the mapping. The analysis is based on industrial production test data and could help identify abnormalities in the chip population.

CSEP CNSI Schuller Lab UCSB